- Blyumkina YU.A. I Vsyesoyuznaya konfyeryentsiya "EHllipsomyetriya - myetod isslyedovaniya fiziko-khimichyeskikh protsyessov na povyerkhnosti tvyerdykh tyel" / Blyumkina YU.A., Svitashyev K.K. // Optika i spyektroskopiya. - 1978. - T.44, N 6. - S.1215-1216.
- Isslyedovaniye osobyennostyei formirovaniya volnovodnogo sloya pri obluchyenii dvuokosi kryemniya ionami bora / Gyerasimyenko N.N., Pan'kin V.G., Svitashyev K.K., TSyeitlin G.M. // ZHurnal tyekhnichyeskoi fiziki. Pis'ma v ryedaktsiyu. - 1978. - T.4, N 10. - S.582-585. - Bibliogr.: 12 nazv.
- Ob opryedyelyenii tolsciny diehlyektrichyeskikh plyenok ehllipsomyetrichyeskim myetodom s ispol'zovaniyem nyemonokhromatichyeskogo istochnika izluchyeniya / Syemyenyenko A.I., Syemyenyenko L.V., Mardyezhov A.S., Svitashyev K.K. // Ukrainskii fizichyeskii zhurnal. - 1978. - T.23, N 3. - S.504-506.
- Optichyeskiye postoyannyye atomarno-chistoi povyerkhnosti gyermaniya i kryemniya i ikh tyempyeraturnyye zavisimosti / Algazin YU.B., Blyumkina YU.A., Gryebnyev N.I., Svitashyev K.K., Syemyenyenko L.V., YAblontsyeva T.M. // Optika i spyektroskopiya. - 1978. - T.45, N 2. - S.330-339. - Bibliogr.: 21 nazv.
- EHllipsomyetrichyeskoye isslyedovaniye sistyem poluprovodnikovaya podlozhka - poluprovodnikovaya ehpitaksial'naya plyenka so slozhnym raspryedyelyeniyem lyegiruyuscyei primyesi / Mardyezhov A.S., Svitashyev K.K., Syemyenyenko A.I., Syemyenyenko L.V. // Mikroehlyektronika. - 1978. - T.7, N 6. - S.545-552. - Bibliogr.: 11 nazv.
- Blyumkina Yu.A. First All-Union Conference on Ellipsometry, a Method for Studying Physical-Chemical Processes on Surfaces of Solids / Blyumkina Yu.A., Svitashev K.K. // Optics and Spectroscopy. - 1978. - V.44, N 6. - P.712-713.
- Deposition of silica films by the oxidation of silane in oxygen. I. The kinetics and physicochemical model of the process / Vasilyeva L.L., Drozdov V.N., Repinsky S.M., Svitashev K.K. // Thin Solid Films. - 1978. - V.55, N 2. - P.221-228.
- Optical constants and temperature dependences of atomically pure surfaces of germanium and silicon / Algazin Yu.B., Blyumkina Yu.A., Grebnev N.I., Svitashev K.K., Semenenko L.V., Yablontseva T.M. // Optics and Spectroscopy. - 1978. - V.45, N 2. - P.183-188. - Bibliogr.: 21 ref.
- Blyumkina YU.A. Isslyedovaniye modulyatsionnoi pogryeshnosti v ehllipsomyetrii / Blyumkina YU.A., Arkhipyenko A.V., Svitashyev K.K. // Optika i spyektroskopiya. - 1979. - T.46, N 3. - S.601-603. - Bibliogr.: 7 nazv.
- Kambalin S.A. Nakoplyeniye zaryada v MNOP-sistyemye s ostrovkovoi plyenkoi na myezhfaznoi granitsye razdyela diehlyektrikov / Kambalin S.A., Svitashyev K.K. // Mikroehlyektronika. - 1979. - T.8, N 3. - S.249-252. - Bibliogr.: 8 nazv.
- Opryedyelyeniye paramyetrov pogloscayuscikh plyenok s pomosc'yu myetoda ehllipsomyetrii / Dagman EH.YE., Pan'kin V.G., Svitashyev K.K., Syemyenyenko A.I., Syemyenyenko L.V., SHvarts N.L. // Optika i spyektroskopiya. - 1979. - T.46, N 3. - S.559-565. - Bibliogr.: 8 nazv.
- Opryedyelyeniye profilya komplyeksnogo pokazatyelya pryelomlyeniya v ionno-vnyedryennykh sloyakh iz ehllipsomyetrichyeskikh izmyeryenii / Mardyezhov A.S., Syeryapin V.G., Lyubinskaya R.I., Svitashyev K.K., Smirnov L.S., Syemyenyenko A.I. // Fizika i tyekhnika poluprovodnikov. - 1979. - T.13, N 12. - S.2347-2353. - Bibliogr.: 23 nazv.
- Osnovy ehllipsomyetrii / Rzhanov A.V., Svitashyev K.K., Syemyenyenko A.I., Syemyenyenko L.V., Sokolov V.K. - Novosibirsk: Nauka, 1979. - 422 s. - Bibliogr.: 875 nazv.
- Oglavlyeniye knigi
- Pyeryekhod myetall - nyemyetall v plyenkakh okisi vol'frama pri izmyenyenii styepyeni okraski / Gritsyenko V.A., Myeyerson YE.YE., Roizin YA.O., Svitashyev K.K. // Avtomyetriya. - 1979. - N 2. - S.55-59. - Bibliogr.: 9 nazv.
- EHllipsomyetrichyeskoye isslyedovaniye tyermodyesorbtsii tonkikh plyenok dvuokisi kryemniya i adsorbirovannykh sloyev s povyerkhnosti monokristallichyeskogo kryemniya / Algazin YU.B., Blyumkina YU.A., Svitashyev K.K., YAblontsyeva T.M. // ZHurnal tyekhnichyeskoi fiziki. - 1979. - T.49, N 11. - S.2349-2352. - Bibliogr.: 7 nazv.
- Blyumkina Yu.A. Modulation error in ellipsometry / Blyumkina Yu.A., Arkhipenko A.V., Svitashev K.K. // Optics and Spectroscopy. - 1979. - V.46, N 3. - P.334-335. - Bibliogr.: 7 ref.
- Determination of the parameters of absorbing films by ellipsometry / Dagman E.E., Pankin,V.G., Svitashev K.K., Semenenko A.I., Semenenko L.V., Shvarts N.L. // Optics and Spectroscopy. - 1979. - V.46, N 3. - P.311-314. - Bibliogr.: 8 ref.
- Ellipsometric study of the thermal desorption of thin silicon dioxide films and adsorbed films from silicon single crystals / Algazin Yu.B., Bliumkina Yu.A., Svitashev K.K., Iablontseva T.M. // Soviet Physics - Technical Physics. - 1979. - V.24. - P.1310-1312.
- Rzhanov A.V. Ellipsometric techniques to study surfaces and thin films // Rzhanov A.V., Svitashev K.K. // Advances in Electronics and Electron Physics. - 1979. - V.49. - P.1-84.
- Algazin YU.B. Kinyetika tyermodyesorbtsii tonkikh i subtonkikh okisnykh pokrytii s povyerkhnosti monokristallichyeskogo kryemniya: ehllipsomyetrichyeskoye isslyedovaniye / Algazin YU.B., Blyumkina YU.A., Svitashyev K.K. // ZHurnal tyekhnichyeskoi fiziki. - 1980. - T.50, N 10. - C.2152-2157. - Bibliogr.: 11 nazv.
- Algoritmy i programmy dlya chislyennogo ryeshyeniya nyekotorykh zadach ehllipsomyetrii / Burykin I.G., Vorob'yeva L.P., Grushyetskii V.V., Dagman EH.YE., Lyubinskaya R.I., Saprykina G.A., Svitashyev K.K., Syemyenyenko A.I., Syemyenyenko L.V.; otv. ryed. Rzhanov A.V. - Novosibirsk: Nauka, 1980. - 186 s.
- Raschyet polyarizatsionnykh uglov D i φ i amplitudnykh koehffitsiyentov otrazhyeniya odnosloinoi i dvukhsloinoi otrazhayuscikh sistyem na proizvol'noi podlozhkye / Vorob'yeva L.P., Lyubinskaya R.I., Svitashyev K.K., Syemyenyenko L.V. // Algoritmy i programmy dlya chislyennogo ryeshyeniya nyekotorykh zadach ehllipsomyetrii / otv. ryed. Rzhanov A.V. - Novosibirsk: Nauka, 1980. - S.6-8.
- Raschyet polyarizatsionnykh uglov D i φ odnosloinoi sistyemy s uchyetom skhodimosti rabochyego svyetovogo puchka / Dagman EH.YE., Saprykina G.A., Svitashyev K.K., Syemyenyenko A.I., Syemyenyenko L.V. // Algoritmy i programmy dlya chislyennogo ryeshyeniya nyekotorykh zadach ehllipsomyetrii / otv. ryed. Rzhanov A.V. - Novosibirsk: Nauka, 1980. - S.15-18.
- Raschyet polyarizatsionnykh uglov D i φ i optichyeskikh paramyetrov N i K pyeryekhodnykh sloyev chyetyryekhsloinoi otrazhayuscyei sistyemy na proizvol'noi podlozhkye / Dagman EH.YE., Saprykina G.A., Svitashyev K.K., Syemyenyenko A.I., Syemyenyenko L.V. // Algoritmy i programmy dlya chislyennogo ryeshyeniya nyekotorykh zadach ehllipsomyetrii / otv. ryed. Rzhanov A.V. - Novosibirsk: Nauka, 1980. - S.8-11.
- Ryed.: EHdyel'man F.L. Struktura komponyentov BIS / EHdyel'man F.L.; otv. ryed. Svitashyev K.K. - Novosibirsk: Nauka, 1980. - 256 s.
- Algazin YU.B. Ob intyerpryetatsii malykh izmyenyenii ehllipsomyetrichyeskikh uglov pri isslyedovanii adsorbtsionno-dyesorbtsionnykh protsyessov / Algazin YU.B., Svitashyev K.K. // EHllipsomyetriya - myetod isslyedovaniya fiziko-khimichyeskikh protsyessov na povyerkhnosti tvyerdykh tyel: tyez. dokl. 2-i vsyesoyuz. konf. (29 iyunya-1 iyulya). - Novosibirsk, 1981. - S.31.
- Algazin YU.B. EHllipsomyetrichyeskoye isslyedovaniye adsorbtsii kisloroda na kryemnii v diapazonye tyempyeratur 20-780 °C / Algazin YU.B., Svitashyev K.K. // EHllipsomyetriya - myetod isslyedovaniya fiziko-khimichyeskikh protsyessov na povyerkhnosti tvyerdykh tyel: tyez. dokl. 2-i vsyesoyuz. konf. (29 iyunya-1 iyulya). - Novosibirsk, 1981. - S.30.
- Algazin YU.B. EHllipsomyetrichyeskoye isslyedovaniye nachal'noi stadii okislyeniya kryemniya v diapazonye tyempyeratur 20-800 °C / Algazin YU.B., Blyumkina YU.A., Svitashyev K.K. // EHllipsomyetriya - myetod isslyedovaniya fiziko-khimichyeskikh protsyessov na povyerkhnosti tvyerdykh tyel: tyez. dokl. 2-i vsyesoyuz. konf. (29 iyunya-1 iyulya). - Novosibirsk, 1981. - S.29.
- Kol'dyayev V.I. Matyematichyeskiye modyeli fizichyeskikh protsyessov inzhyektsii i ryelaksatsii zaryada v diehlyektrichyeskikh sloyakh MDP-tranzistorov s pamyat'yu / Kol'dyayev V.I., Svitashyev K.K. - Novosibirsk, 1981. - 83 s. - (Pryeprint / Akad. nauk SSSR, Sib. otd-niye, In-t fiziki poluprovodnikov; N 59-81). - Bibliogr.: s.75-82.
- EHllipsomyetrichyeskoye isslyedovaniye tyermichyeskogo okislyeniya vanadiya / Lanskaya T.G., Lyubinskaya R.I., Svitashyeva S.N., Svitashyev K.K. // ZHurnal tyekhnichyeskoi fiziki. - 1981. - T.51, N 9. - S.1920-1927. - Bibliogr.: 20 nazv.
- Rzhanov A.V.Covyershyenstvovat' trud uchyenogo: iz opyta raboty kollyektiva Instituta fiziki poluprovodnikov Sibirskogo otdyelyeniya AN SSSR / Rzhanov A.V., Svitashyev K. // Vyechyernii Novosibirsk. - 1981. - 24 marta.
- Svitashyev K. Vzyat' na syebya otvyetstvyennost' / Svitashyev K., Novototskii-Vlasov YU., Pokrovskaya S. // Za nauku v Sibiri. - 1981. - 26 noyab. - C.5.
- K 50-lyetiyu so dnya rozhdyeniya I.G.Nyeizvyestnogo (Institut fiziki poluprovodnikov SO AN SSSR).
- Svitashyeva S.N. O vozmozhnostyakh kombinatsii myetodov ehllipsomyetrii i spyektrointyerfyeromyetrii na primyerye sistyemy Si-SiO2 / Svitashyeva S.N., SHtyeingol'ts Z.I., Svitashyev K.K. // EHllipsomyetriya - myetod isslyedovaniya fiziko-khimichyeskikh protsyessov na povyerkhnosti tvyerdykh tyel: tyez. dokl. 2-i vsyesoyuz. konf. (29 iyunya-1 iyulya). - Novosibirsk, 1981. - S.128.
- Syemyenyenko A.I. O korryektnosti intyerpryetatsii ryezul'tatov ehllipsomyetrichyeskikh izmyeryenii / Syemyenyenko A.I., Ryezvyi R.R., Svitashyev K.K. // EHllipsomyetriya - myetod isslyedovaniya fiziko-khimichyeskikh protsyessov na povyerkhnosti tvyerdykh tyel: tyez. dokl. 2-i vsyesoyuz. konf. (29 iyunya-1 iyulya). - Novosibirsk, 1981. - S.21. - Bibliogr.: 1 nazv.
- Tyempyeraturnaya zavisimost' paramyetrov kompyensatora / Mardyezhov A.S., Svitashyev K.K., Syemyenyenko A.I., KHasanov T.KH. // EHllipsomyetriya - myetod isslyedovaniya fiziko-khimichyeskikh protsyessov na povyerkhnosti tvyerdykh tyel: tyez. dokl. 2-i vsyesoyuz. konf. (29 iyunya - 1 iyulya). - Novosibirsk, 1981. - S.123.
- EHllipsomyetriya nyeodnorodnykh sloyev v kryemnii, implantirovannom ionami nyeona, kryemniya, fosfora i argona / Mardyezhov A.S., Syeryapin V.G., Lyubinskaya R.I., Svitashyev K.K., Syemyenyenko A.I., Smirnov L.S. // EHllipsomyetriya - myetod isslyedovaniya fiziko-khimichyeskikh protsyessov na povyerkhnosti tvyerdykh tyel: tyez. dokl. 2-i vsyesoyuz. konf. (29 iyunya-1 iyulya). - Novosibirsk, 1981. - S.96. - Bibliogr.: 1 nazv.
- Ellipsometric study of the thermal oxidation of vanadium / Lanskaya T.G., Lyubinskaya R.I., Svitasheva S.N., Svitashev K.K. // Soviet physics. Technical physics. - 1981. - V.26, N 9. - P.1115-1119. - Bibliogr.: 20 ref.
- Ryed.: Azzam R.M.A. EHllipsomyetriya i polyarizovannyi svyet: [pyer. s angl.] / Azaam R., Bashara N.; pod ryed. Rzhanova A.V., Svitashyeva K.K. - M.: Mir, 1981. - 583 c. - (Pyeryevod izd.: Ellipsometry and polarized light / R.M.A.Azzam, N.M.Bashara (Amsterdam etc., 1977).
- Ryed.: Alyeksandrov L.N. Mnogosloinyye plyenochnyye struktury dlya istochnikov svyeta / Alyeksandrov L.N., Ivantsyev A.S.; otv. ryed. Svitashyev K.K. - Novosibirsk: Nauka, 1981. - 137 s.
- Rzhanov A.V. Poluprovodnikovaya mikroehlyektronika i tyekhnichyeskii progryess / Rzhanov A.V., Svitashyev K.K. // Mikroehlyektronika. - 1982. - T.11, N 6. - S.499-511. - Bibliogr.: 21 nazv.
- EHllipsomyetrichyeskii myetod opryedyelyeniya kachyestva obrabotki povyerkhnosti / Rzhanov A.V., Svitashyeva S.N., Svitashyev K.K., Sokolov V.K., Ashkyerov YU.V., Osadchyev L.A., TSyesnyek L.S. // Doklady Akadyemii nauk SSSR. - 1982. - T.267, N 2. - C.373-376. - Bibliogr.: 10 nazv.
- Ellipsometric method of determining the quality of surface processing / Rzhanov A.V., Svitasheva S.N., Svitashev K.K., Sokolov V.K., Ashkerov Yu.V., Osadchev L.A., Tsesnek L.S. // Soviet Physics Doklady. - 1982. - V.27. - P.967. - Bibliogr.: 10 ref.
- Izmyenyeniye ehllipsomyetrichyeskikh paramyetrov v zavisimosti ot myekhanichyeskoi obrabotki povyerkhnosti / Svitashyeva S.N., Svitashyev K.K., Syemyenov YE.V., Vasil'yev A.G. // Povyerkhnost'. Fizika, khimiya, myekhanika. - 1983. - N 12. - S.64-71. - Bibliogr.: 16 nazv.
- Kol'dyayev V.I. Vliyaniye tyempyeratury na kinyetiku polyarizatsii MNOP-struktur / Kol'dyayev V.I., Svitashyev K.K. // Mikroehlyektronika. - 1983. - T.12, N 4. - S.363-371. - Bibliogr.: 23 nazv.
- Rzhanov A.V. Grafichyeskii myetod intyerpryetatsii ryezul'tatov ehllipsomyetrichyeskikh izmyeryenii na shyerokhovatykh povyerkhnostyakh / Rzhanov A.V., Svitashyeva S.N., Svitashyev K.K. // Doklady Akadyemii nauk SSSR. - 1983. - T.273, N 5. - S.1123-1126. - Bibliogr.: 6 nazv.
- Rzhanov A.V. EHllipsomyetrichyeskiye myetody isslyedovaniya povyerkhnosti i tonkikh plyenok / Rzhanov A.V., Svitashyev K.K. // EHllipsomyetriya - myetod isslyedovaniya povyerkhnosti: sb. statyei / otv. ryed. Rzhanov A.V. - Novosibirsk: Nauka, 1983. - S.3-6.
- Svitashyev K.K. Izmyeryeniya malykh vrascyenii ploskosti polyarizatsii / Svitashyev K.K., KHasanov T. // Optika i spyektroskopiya. - 1983. - T.54, N 3. - S.538-539. - Bibliogr.: 2 nazv.
- Rzhanov A.V. Graphical method of interpreting the results of ellipsometric measurements on rough surfaces / Rzhanov A.V., Svitasheva S.N., Svitashev K.K. // Soviet Physics Doklady. - 1983. - V.28. - P.1059. - Bibliogr.: 6 ref.
- Svitashev K.K. Measuring small polarization-plane rotations / Svitashev K.K., Khasanov T. // Optics and Spectroscopy. - 1983. - V.54, N 3. - P.317-318. - Bibliogr.: 2 ref.
- Mardyezhov A.S. Kompyensator dlya spyektral'nykh isslyedovanii / Mardyezhov A.S., Svitashyev K.K., KHasanov T. // Optika i spyektroskopiya. - 1984. - T.57, N 2. - S.366-368. - Bibliogr.: 4 nazv.
- O ryeshyenii obratnoi zadachi ehllipsomyetrii dlya nyeodnorodnykh sistyem / Dagman EH.YE., Lyubinskaya R.I., Mardyezhov A.S., Svitashyev K.K., Syemyenyenko A.I., SHvyets V.A. // Ukrainskii fizichyeskii zhurnal. - 1984. - T.29, N 2. - S.187-193.
- Kol'dyaev V.I. Effect of temperature on the polarization kinetics of MNOS structures / Kol'dyaev V.I., Svitashev K.K. // Soviet Misroelectronics. - 1984. - V.12, N 4. - P.197-204.
- Mardezhov A.S. Compensator for spectral investigations / Mardezhov A.S., Svitashev K.K., Khasanov T. // Optics and Spectroscopy. - 1984. - V.57, N 2. - P.221-222. - Bibliogr.: 4 ref.
- Isslyedovaniye nyeodnorodnykh sloyev v kryemnii, obluchyennom ionami nyeona, kryemniya, fosfora i argona, myetodom ehllipsomyetrii / Mardyezhov A.S., Syeryapin V.G., Lyubinskaya R.I., Svitashyev K.K., Smirnov L.S., Syemyenyenko A.I. // Fizika i tyekhnika poluprovodnikov. - 1985. - T.19, N 3. - S.564.
- Opryedyelyeniye optichyeskikh postoyannykh odnoosnykh kristallov s uchyetom povyerkhnostnoi izotopnoi plyenki iz ehllipsomyetrichyeskikh izmyeryenii / Lyubinskaya R.I., Mardyezhov A.S., Svitashyev K.K., KHasanov T. // Optika i spyektroskopiya. - 1985. - T.59, N 2. - S.353-356. - Bibliogr.: 9 nazv.
- Determination of the optical constants of uniaxial crystals with allowance made for an isotropic surface film on the basis of ellipsometric measurements / Lyubinskaya R.I., Mardezhov A.S., Svitashev K.K., Khasanov T. // Optics and Spectroscopy. - 1985. - V.59, N 2. - P.212-214. - Bibliogr.: 9 ref.
- Kol'dyayev V.I. Matyematichyeskoye modyelirovaniye protsyessov pyeryenosa ehlyektronov v diehlyektrikakh MDP-struktur v sil'nykh polyakh / Kol'dyayev V.I., Svitashyev K.K. // Mikroehlyektronika. - 1986. - T.15, N 3. - S.255-270. - Bibliogr.: 86 nazv.
- Mardyezhov A.S. Uchyet plyenki na granitsye vozdukh - zhidkost' pri provyedyenii immyersionnykh izmyeryenii chyeryez ploskoparallyel'nyi sloi zhidkosti / Mardyezhov A.S., Svitashyev K.K., SHvyets V.A. // Ukrainskii fizichyeskii zhurnal. - 1986. - T.31, N 1. - S.48-50.
- Svitashyev K.K. Uchyet optichyeskoi aktivnosti kompyensatora pri yustirovkye ehllipsomyetra / Svitashyev K.K., KHasanov T. // Optika i spyektroskopiya. - 1986. - T.60, N 2. - S.399-401. - Bibliogr.: 5 nazv.
- Svitashyeva S.N. Isslyedovaniye protsyessa obrazovaniya plyenki yestyestvyennogo okisla na povyerkhnosti myedi myetodom ehllipsomyetrii / Svitashyeva S.N., Lyubinskaya R.I., Svitashyev K.K. // Povyerkhnost'. Fizika, khimiya, myekhanika. - 1986. - N 11. - S.80-85. - Bibliogr.: 18 nazv.
- Ellipsometric analysis of inhomogeneous structures on the basis of complex reflection coefficients / Lubinskaya R.I., Mardezhov A.S., Svitashev K.K., Shvets V.A. // Surface Science. - 1986. - T.177, N 3. - P.625-641.
- Svitashev K.K. Method of allowing for the optical activity of the compensator when adjusting an ellipsometer / Svitashev K.K., Khasanov T. // Optics and Spectroscopy. - 1986. - V.60, N 2. - P.243-244. - Bibliogr.: 5 ref.
- Vasilev V.V. Effect of hydrogen on photoluminescence spectra of silicon nitride amorphous films / Vasilev V.V., Mikhailovskii I.P., Svitashev K.K. // Physica Status Solidi. A. - 1986. - V.95, N 1. - P.K37-K42. - Bibliogr.: 15 ref.
- Ryed.: Intyegral'naya optika. Fizichyeskiye osnovy. Prilozhyeniya: [sb. dokl.] / otv. ryed. Svitashyev K.K., Il'ina L.A. - Novosibirsk: Nauka, 1986. - 127 s.
|
