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CoverIn-situ electron microscopy at high resolution / ed. by F.Banhart. - Singapore; Hackensack: World Scientific, 2008. - vi, 311 p.: ill. - Incl. bibl. ref. - Ind.: p.309-311. - ISBN-10 981-279-733-5; ISBN-13 978-981-279-733-9
 

Оглавление / Contents
 
Chapter 1  Introduction to In-Situ Electron Microscopy .......... 1
           Florian Banhart
Chapter 2  Observation of Dynamic Processes using 
           Environmental Transmission or Scanning
           Transmission Electron Microscopy .................... 15
           Renu Sharma
Chapter 3  In-Situ High-Resolution Observation of 
           Solid-Solid, Solid-Liquid and Solid-Gas Reactions ... 49
           Hiroyasu Saka
Chapter 4  In-Situ Transmission Electron Microscopy: 
           Nanoindentation and Straining Experiments .......... 115
           Wouter A. Soer and Jeff T. De Hosson
Chapter 5  In-Situ HRTEM Studies of Interface Dynamics 
           During Solid-Solid Phase Transformations in Metal
           Alloys ............................................. 161
           James M. Howe
Chapter 6  In-Situ ТЕМ of Filled Nanotubes: Heating, 
           Electron Irradiation, Electrical and Mechanical
           Probing ............................................ 187
           Dmitri Golberg and Yoshio Bando
Chapter 7  In-Situ Ion and Electron Beam Effects on the 
           Fabrication and Analysis of Nanomaterials .......... 229
           Kazuo Furuya, Minghui Song, and Masayuki Shimojo
Chapter 8  Electron Irradiation of Nanomaterials in the 
           Electron Microscope ................................ 259
           Florian Banhart
Chapter 9  In-Situ Observation of Atomic Defects in Carbon 
           Nanostructures ..................................... 297
           Kazu Suenaga
Index ......................................................... 309

Архив выставки новых поступлений | Отечественные поступления | Иностранные поступления | Сиглы
 

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