Echlin P. Handbook of sample preparation for scanning electron microscopy and x-ray microanalysis. - New York: Springer, 2009. - xi, 330 p.: ill. - Ref.: p.317-322. - Ind.: p.323-330. - ISBN 978-0-387-85730-5  Место хранения:   049 | Институт водных и экологических проблем CO РАН | Барнаул | Библиотека

Оглавление / Contents

Acknowledgments ................................................ ix Chapter 1 Introduction ......................................... 1 Chapter 2 Sample Collection and Selection ..................... 11 Chapter 3 Sample Preparation Tools ............................ 19 Chapter 4 Sample Support ...................................... 31 Chapter 5 Sample Embedding and Mounting ....................... 47 Chapter 6 Sample Exposure ..................................... 65 Chapter 7 Sample Dehydration .................................. 97 Chapter 8 Sample Stabilization for Imaging in the SEM ........ 137 Chapter 9 Sample Stabilization to Preserve Chemical Identity ........................................... 185 Chapter 10 Sample Cleaning .................................... 235 Chapter 11 Sample Surface Charge Elimination .................. 247 Chapter 12 Sample Artifacts and Damage ........................ 299 Chapter 13 Additional Sources of Information .................. 307 References .................................................... 317 Index ......................................................... 323