Milosevic M. Internal reflection and ATR spectroscopy (Hoboken, 2012). - ОГЛАВЛЕНИЕ / CONTENTS
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ОбложкаMilosevic M. Internal reflection and ATR spectroscopy. - Hoboken: Wiley, 2012. - xvi, 239 p.: ill. - (Chemical analysis; vol.176). - Ind.: p.237-239. - Пер. загл.: Внутреннее отражение и ATR спектроскопия. - ISBN 97-0-470-27832-1
 

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Оглавление / Contents
 
Preface ...................................................... xiii
1  Introduction to Spectroscopy ................................. 1
   1.1  History ................................................. 1
   1.2  Definition of Transmittance and Reflectance ............. 6
   1.3  The Spectroscopic Experiment and the Spectrometer ...... 10
   1.4  Propagation of Light through a Medium .................. 13
   1.5  Transmittance and Absorbance ........................... 15
   1.6  S/N in a Spectroscopic Measurement ..................... 16
2  Harmonic Oscillator Model for Optical Constants ............. 20
   2.1  Harmonic Oscillator Model for Polarizability ........... 20
   2.2  Clausius-Mossotti Equation ............................. 25
   2.3  Refractive Index ....................................... 26
   2.4  Absorption Index and Concentration ..................... 29
3  Propagation of Electromagnetic Energy ....................... 31
   3.1  Poynting Vector and Flow of Electromagnetic Energy ..... 31
   3.2  Linear Momentum of Light ............................... 34
   3.3  Light Absorption in Absorbing Media .................... 35
   3.4  Lambert Law and Molecular Cross Section ................ 36
4  Fresnel Equations ........................................... 39
   4.1  Electromagnetic Fields at the Interface ................ 39
   4.2  Snell's Law ............................................ 41
   4.3  Boundary Conditions at the Interface ................... 42
   4.4  Fresnel Formulae ....................................... 43
   4.5  Reflectance and Transmitance of Interface .............. 44
   4.6  Snell's Pairs .......................................... 46
   4.7  Normal Incidence ....................................... 47
   4.8  Brewster's Angle ....................................... 47
   4.9  The Case of the 45° Angle of Incidence ................. 48
   4.10 Total Internal Reflection .............................. 49
5  Evanescent Wave ............................................. 55
   5.1  Exponential Decay and Penetration Depth ................ 55
   5.2  Energy Flow at a Totally Internally Reflecting
        Interface .............................................. 58
   5.3  The Evanescent Wave in Absorbing Materials ............. 59
6  Electric Fields at a Totally Internally Reflecting 
   Interface ................................................... 61
   6.1  Ex, Ey, and Ez for s-Polarized Incident Light .......... 61
   6.2  Ex, Ey, and Ez for p-Polarized Incident Light .......... 62
7  Anatomy of ATR Absorption ................................... 67
   7.1  Attenuated Total Reflection (ATR) Reflectance for 
        s- and p-Polarized Beam ................................ 67
   7.2  Absorbance Transform of ATR Spectra .................... 69
   7.3  Weak Absorption Approximation .......................... 70
   7.4  Supercritical Reflectance and Absorption of
        Evanescent Wave ........................................ 73
   7.5  The Leaky Interface Model .............................. 76
8  Effective Thickness ......................................... 79
   8.1  Definition and Expressions for Effective Thickness ..... 79
   8.2  Effective Thickness and Penetration Depth .............. 80
   8.3  Effective Thickness and ATR Spectroscopy ............... 82
   8.4  Effective Thickness for Strong Absorptions ............. 84
9  Internal Reflectance near Critical Angle .................... 85
   9.1  Transition from Subcritical to Supercritical
        Reflection ............................................. 85
   9.2  Effective Thickness and Refractive Index of Sample ..... 87
   9.3  Critical Angle and Refractive Index of Sample .......... 88
10 Depth Profiling ............................................. 92
   10.1 Energy Absorption at Different Depths .................. 92
   10.2 Thin Absorbing Layer on a Nonabsorbing Substrate ....... 93
   10.3 Thin Nonabsorbing Film on an Absorbing Substrate ....... 94
   10.4 Thin Nonabsorbing Film on a Thin Absorbing Film on 
        a Nonabsorbing Substrate ............................... 94
11 Multiple Interfaces ......................................... 97
   11.1 Reflectance and Transmittance of a Two-Interface
        System ................................................. 97
   11.2 Very Thin Films ....................................... 100
   11.3 Interference Fringes .................................. 101
   11.4 Normal Incidence ...................................... 102
   11.5 Interference Fringes and Transmission Spectroscopy .... 104
   11.6 Thin Films and ATR .................................... 108
   11.7 Internal Reflection: Subcritical, Supercritical, and
        in between ............................................ 109
   11.8 Unusual Fringes ....................................... 110
   11.9 Penetration Depth Revisited ........................... 113
   11.10 Reflectance and Transmittance of a Multiple
        Interface System ...................................... 116
12 Metal Optics ............................................... 121
   12.1 Electromagnetic Fields in Metals ...................... 121
   12.2 Plasma ................................................ 126
   12.3 Reflectance of Metal Surfaces ......................... 127
   12.4 Thin Metal Films on Transparent Substrates ............ 130
   12.5 Curious Reflectance of Extremely Thin Metal Films ..... 132
   12.6 ATR Spectroscopy through Thin Metal Films ............. 134
13 Grazing Angle ATR (GAATR) Spectroscopy ..................... 136
   13.1 Attenuated Total Reflection (ATR) Spectroscopy of
        Thin Films on Silicon Substrates ...................... 136
   13.2 Enhancement for 5- and p-Polarized Light .............. 137
   13.3 Enhancement and Film Thickness ........................ 139
   13.4 Electric Fields in a Very Thin Film on a Si 
        Substrate ............................................. 141
   13.5 Source of Enhancement ................................. 143
   13.6 GAATR Spectroscopy .................................... 145
14 Super Grazing Angle Reflection Spectroscopy (SuGARS) ....... 147
   14.1 Reflectance of Thin Films on Metal Substrates ......... 147
   14.2 Problem of Reference .................................. 148
   14.3 Sensitivity Enhancement ............................... 150
15 ATR Experiment ............................................. 151
   15.1 Multiple Reflection Attenuated Total Reflection
   (ATR) ...................................................... 151
   15.2 Facet Reflections ..................................... 155
   15.3 Beam Spread and the Angle of Incidence ................ 156
   15.4 Effect of Facet Shape ................................. 158
   15.5 Beam Spread and the Number of Reflections in
        Multiple Reflection ATR ............................... 160
   15.6 Effect of Beam Alignment on Multiple Reflection
        ATR ................................................... 162
   15.7 Change in the Refractive Index of the Sample due to
        Concentration Change .................................. 166
16 ATR Spectroscopy of Small Samples .......................... 168
   16.1 Benefits of Attenuated Total Reflection (ATR) for
        Microsampling ......................................... 168
   16.2 Contact Problem for Solid Samples ..................... 170
17 Surface Plasma Waves ....................................... 172
   17.1 Excitation of Surface Plasma Waves .................... 172
   17.2 Effect of Metal Film Thickness on Reflectance ......... 173
   17.3 Effect of the Refractive Index of Metal on
        Reflectance ........................................... 174
   17.4 Effect of the Absorption Index of Metal on
        Reflectance ........................................... 174
   17.5 Use of Plasmons for Detecting Minute Changes of the
        Refractive Index of Materials ......................... 175
   17.6 Use of Plasmons for Detecting Minute Changes
        of the Absorption Index of Materials .................. 178
18 Extraction of Optical Constants of Materials from
   Experiments ................................................ 180
   18.1 Extraction of Optical Constants from Multiple
        Experiments ........................................... 180
   18.2 Kramers-Kronig Relations .............................. 184
   18.3 Kramers-Kronig Equations for Normal Incidence 
        Reflectance ........................................... 187
19 ATR Spectroscopy of Powders ................................ 192
   19.1 Propagation of Light through Inhomogeneous Media ...... 192
   19.2 Spectroscopic Analysis of Powdered Samples ............ 193
   19.3 Particle Size and Absorbance of Powders ............... 195
   19.4 Propagation of Evanescent Wave in Powdered Media ...... 198
20 Energy Flow at a Totally Internally Reflecting Interface ... 209
   20.1 Energy Conservation at a Totally Reflecting
        Interface ............................................. 209
   20.2 Speed of Propagation and the Formation of an 
        Evanescent Wave ....................................... 212
21 Orientation Studies and ATR Spectroscopy ................... 214
   21.1 Oriented Fraction and Dichroic Ratio .................. 214
   21.2 Orientation and Field Strengths in Attenuated Total
        Reflection (ATR) ...................................... 217
22 Applications of ATR Spectroscopy ........................... 220
   22.1 Solid Samples ......................................... 220
   22.2 Liquid Samples ........................................ 220
   22.3 Powders ............................................... 221
   22.4 Surface-Modified Solid Samples ........................ 221
   22.5 High Sample Throughput ATR Analysis ................... 221
   22.6 Process and Reaction Monitoring ....................... 222

Appendix A ATR Correction ..................................... 224
Appendix В Quantification in ATR Spectroscopy ................. 227
   
Index ......................................................... 237


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