Scanning probe microscopy: characterization, nanofabrication and device application of functional materials / ed. by Vilarinho P.M., Rosenwaks Y., Kingon A. - Dordrecht: Kluwer Academic Publishers, 2005. - xxxvii, 488 p.: ill. - (NATO science series II. Mathematics, physics and chemistry; 186). - Incl. bibl. ref. - ISBN 1-4020-3018-5  Место хранения:   038 | Институт химии и химической технологии CO РАН | Красноярск

Оглавление / Contents

PREFACE ........................................................ ix ON THE NATO ASI .............................................. xiii ON THE BOOK .................................................... xv ACKNOWLEDGEMENTS .............................................. xvi PHOTO OF THE GROUP ........................................... xvii ADDRESS LIST OF THE AUTHORS ................................... xxi LIST OF PARTICIPANTS .......................................... xxv Part I - Fundamentals of Functional Materials FUNCTIONAL MATERIALS: PROPERTIES, PROCESSING AND APPLICATIONS P.M. Vilarinho ............................................... 3 SCALING OF SILICON-BASED DEVICES TO SUBMICRON DIMENSIONS A.I. Kingon ................................................. 35 UNSOLVED PROBLEMS IN FERROELECTRICS FOR SCANNING PROBE MICROSCOPY J.F. Scott .................................................. 51 Part II - Fundamentals of Scanning Probe Techniques PRINCIPLES OF BASIC AND ADVANCED SCANNING PROBE MICROSCOPY D.A. Bonnell and R. Shao .................................... 11 NANOSCALE PROBING OF PHYSICAL AND CHEMICAL FUNCTIONALITY WITH NEAR-FIELD OPTICAL MICROSCOPY L.M. Eng ................................................... 103 NANOSCALE ELECTRONIC MEASUREMENTS OF SEMICONDUCTORS USING KELVIN PROBE FORCE MICROSCOPY Y. Rosenwaks and R. Shikler ................................ 119 EXPANDING THE CAPABILITIES OF THE SCANNING TUNNELING MICROSCOPE K.F. Kelly, Z.J. Donhauser, B.A. Mantooth and P.S. Weiss ................................................. 153 FUNCTIONS OF NC - AFM ON ATOMIC SCALE S. Morita, N. Oyabu, T. Nishimoto, R. Nishi, O. Custance, I. Yi and Y. Sugawara ......................... 173 Part III - Application of Scanning Techniques to Functional Materials SCANNING PROBE MICROSCOPY OF PIEZOELECTRIC AND TRANSPORT PHENOMENA IN ELECTROCERAMIC MATERIALS S.V. Kalinin and D.A. Bonnell .............................. 199 SFM-BASED METHODS FOR FERROELECTRIC STUDIES A. Gruverman ............................................... 223 SCANNING TUNNELING SPECTROSCOPY: LOCAL DENSITY OF STATES AND SPIN DISTRIBUTION OF INTERACTING ELECTRON SYSTEMS M. Morgenstern ............................................. 251 NANOINSPECTION OF DIELECTRIC AND POLARIZATION PROPERTIES AT INNER AND OUTER INTERFACES IN FUNCTIONAL FERROELECTRIC PZT THIN FILMS L.M. Eng ................................................... 275 MICROSCALE CONTACT CHARGING ON A SILICON OXIDE S. Morita, T. Uchihashi, К. Okamoto, M. Abe and Y. Sugawara ................................................ 289 CONSTRUCTIVE NANOLITHOGRAPHY S.R. Cohen, R. Maoz and J. Sagiv ........................... 309 NANOMETER-SCALE ELECTRONICS AND STORAGE K.F. Kelly, Z.J. Donhauser, P.A. Lewis, R.K. Smith and P.S. Weiss ............................................. 333 Part IV - Contributed papers STM TIPS FABRICATION FOR CRITICAL DIMENSION MEASUREMENTS A. Pasquini, G.B. Picotto and M. Pisani .................... 357 SCANNING PROBE MICROSCOPY CHARACTERIZATION OF FERROELECTRICS DOMAINS AND DOMAINS WALLS IN KTiOP04 C. Canalias, R. Clemens, J. Hellström, F. Laurell, J. Wittborn and H. Karlsson ................................ 363 IMAGING LOCAL DIELECTRIC AND MECHANICAL RESPONSES WITH DYNAMIC HETERODYNED ELECTROSTATIC FORCE MICROSCOPY D.R. Oliver, K.M. Cheng, A. Pu, D.J. Thomson and G.E. Bridges ............................................... 371 AFM PATTERNING OF SrTiO3-δ THIN FILMS AND DEVICE APPLICATIONS L. Pellegrino .............................................. 387 NANOSCALE INVESTIGATION OF A RAYLEIGH WAVE ON LiNb03 J. Yang and R. Koch ........................................ 399 SCANNING CAPACITANCE FORCE MICROSCOPY AND KELVIN PROBE FORCE MICROSCOPY OF NANOSTRUCTURES EMBEDDED IN SiO2 G. Tallarida, S. Spiga and M. Fanciulli .................... 405 ELECTRICAL CHARACTERISATION OF III-V BURIED HETERO STRUCTURE LASERS BY SCANNING CAPACITANCE MICROSCOPY O. Douheret, K. Maknys and S. Anand ........................ 413 PROBING THE DENSITY OF STATES OF HIGH TEMPERATURE SUPERCONDUCTORS WITH POINT CONTACT TUNNELING SPECTROSCOPY L. Ozyuzer, J.F. Zasadzinski, N. Miyakawa and K.E. Gray .... 425 ANNEALING INFLUENCE ON CO ULTRATHIN FILM MORPHOLOGY IN MBE GROWN Co/Au BILAYERS A. Wawro, L.T. Baczewski, P. Pankowski, P. Aleszkiewicz, M. Kisielewski, I. Sveklo and A. Maziewski ................. 435 CORRELATION BETWEEN THE SURFACE RELIEF AND INTERFACES STRUCTURE OF Fe/Cr SUPERLATTICES AND ELECTROMAGNETIC WAVES PENETRATION A. Rinkevich, L. Romashev and V. Ustinov ................... 443 MAGNETORESISTANCE AND MICROSTRUCTURE OF MAGNETIC THIN FILM MULTILAYERS J. Neamtu, M. Volmer ....................................... 449 SPM INVESTIGATION OF THIOLATED GOLD NANOPARTICLE PATTERNS DEPOSITED ON DIFFERENT SELF-ASSEMBLED SUBSTRATES F. Sbrana, M. T. Parodi, D. Ricci and E. Di Zitti .......... 457 AFM OF GUANINE ADSORBED ON HOPG UNDER ELECTROCHEMICAL CONTROL A.M. Chiorcea and A.M. Oliveira Brett ...................... 461 DYNAMICS IN MODEL MEMBRANES AND DNA-MEMBRANE COMPLEXES USING TEMPERATURE CONTROLLED ATOMIC FORCE MICROSCOPY Z.V. Leonenko and D.T. Cramb ............................... 475 INDEX ......................................................... 485