Science of microscopy. Vol.1 / ed. by Hawkes P.W., Spence J.C.H. - New York: Springer, 2007. - xviii, 747, 26 p.: ill. - ISBN 978-0-387-25296-4  Место хранения:   014 | Институт теоретической и прикладной механики СО РАН | Новосибирск | Библиотека

Оглавление / Contents

VOLUME I PART I IMAGING WITH ELECTRONS ................................... 1 1. Atomic Resolution Transmission Electron Microscopy ........... 3 Angus I. Kirkland, Shery L.-Y. Chang and John L. Hutchison 2. Scanning Transmission Electron Microscopy ................... 65 Peter D. Nellist 3. Scanning Electron Microscopy ............................... 133 Rudolf Reichelt 4. Analytical Electron Microscopy ............................. 273 Gianluigi Botton 5. High-Speed Electron Microscopy ............................. 406 Wayne E. King, Michael R. Armstrong, Oleg Bostanjoglo, and Bryan W. Reed 6. In Situ Transmission Electron Microscopy ................... 445 Frances M. Ross 7. Cryoelectron Tomography (CET) .............................. 535 Juergen M. Plitzko and Wolfgang Baumeister 8. LEEM and SPLEEM ............................................ 605 Ernst Bauer 9. Photoemission Electron Microscopy (РЕЕМ) ................... 657 Jun Feng and Andreas Scholl 10.Aberration Correction ...................................... 696 Peter W. Hawkes Index .......................................................... I1